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| Photo | Mfr. Part # | Availability | Price | Quantity | Datasheet | Packaging | Series | ProductStatus | LogicType | SupplyVoltage | NumberofBits | OperatingTemperature | MountingType |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
SN74LVC161284DLIC BUS INTERF TRI-STATE 48-SSOP |
353 | - |
RFQ |
Datasheet |
Tube | 74LVC | Active | IEEE STD 1284 Translation Transceiver | 3V ~ 3.6V | 19 | 0°C ~ 70°C | Surface Mount |
|
SY100EL16VZGIC RECEIVER 5V/3.3V DIFF 8SOIC |
345 | - |
RFQ |
Tube | 100EL | Active | Differential Receiver | 3.3V, 5V | 1 | -40°C ~ 85°C | Surface Mount | |
|
MC100LVEL16DTGIC RECEIVER ECL DIFF 3.3V 8TSSOP |
3,447 | - |
RFQ |
Datasheet |
Tube | 100LVEL | Active | Differential Receiver | 3V ~ 3.8V | 1 | -40°C ~ 85°C | Surface Mount |
|
MC100LVEL16DGIC RECEIVER ECL DIFF 3.3V 8SOIC |
2,013 | - |
RFQ |
Datasheet |
Tube | 100LVEL | Active | Differential Receiver | 3V ~ 3.8V | 1 | -40°C ~ 85°C | Surface Mount |
|
SN7497NIC SYNC 6BIT BIN RATE MULT 16DIP |
2,313 | - |
RFQ |
Datasheet |
Tube | 7400 | Active | Binary Rate Multiplier | 4.75V ~ 5.25V | 6 | 0°C ~ 70°C | Through Hole |
|
SN74BCT8374ADWIC SCAN TEST DEVICE W/FF 24-SOIC |
3,938 | - |
RFQ |
Datasheet |
Tube | 74BCT | Active | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount |
|
|
SN74BCT8244ADWIC SCAN TEST DEVICE BUFF 24-SOIC |
2,273 | - |
RFQ |
Datasheet |
Tube | 74BCT | Active | Scan Test Device with Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount |
|
|
SN74LS294NIC PROG FREQ DIV/TIMER 16-DIP |
2,711 | - |
RFQ |
Datasheet |
Tube | 74LS | Active | Programmable Frequency Dividers/Digital Timers | 4.75V ~ 5.25V | - | 0°C ~ 70°C | Through Hole |
|
|
SN74LS292NIC PROG FREQ DIV/TIMER 16-DIP |
3,763 | - |
RFQ |
Datasheet |
Tube | 74LS | Active | Programmable Frequency Dividers/Digital Timers | 4.75V ~ 5.25V | - | 0°C ~ 70°C | Through Hole |
|
NB7VQ1006MMNGIC EQUALIZER RECEIVER 24-QFN |
2,426 | - |
RFQ |
Datasheet |
Tube | - | Active | Equalizer Receiver | 1.71V ~ 2.625V | 1 | -40°C ~ 85°C | Surface Mount |
|
SN74LVC1GX04DCKTIC CRYSTAL OSC DRIVER SC70-6 |
519 | - |
RFQ |
Datasheet |
Tape & Reel (TR),Cut Tape (CT) | 74LVC | Active | Crystal Oscillator Driver | 1.65V ~ 5.5V | 1 | -40°C ~ 125°C (TA) | Surface Mount |
|
CD74HCT283MIC BIN FULL 4BIT ADD CAR 16SOIC |
894 | - |
RFQ |
Datasheet |
Tube | 74HCT | Active | Binary Full Adder with Fast Carry | 4.5V ~ 5.5V | 4 | -55°C ~ 125°C | Surface Mount |
|
SN74ACT1284DWIC 7-BIT BUS INTERFACE 20-SOIC |
475 | - |
RFQ |
Datasheet |
Tube | 74ACT | Active | IEEE STD 1284 Translation Transceiver | 4.5V ~ 5.5V | 7 | 0°C ~ 70°C | Surface Mount |
|
SN74TVC3010PWIC 10BIT VOLTAGE CLAMP 24-TSSOP |
3,814 | - |
RFQ |
Datasheet |
Tube | - | Active | Voltage Clamp | - | 10 | -40°C ~ 85°C | Surface Mount |
|
|
SN74TVC3010DWIC 10BIT VOLTAGE CLAMP 24-SOIC |
315 | - |
RFQ |
Datasheet |
Tube | - | Active | Voltage Clamp | - | 10 | -40°C ~ 85°C | Surface Mount |
|
|
SN74ABT8245DWIC SCAN TEST DEV/TXRX 24-SOIC |
2,659 | - |
RFQ |
Datasheet |
Tube | 74ABT | Active | Scan Test Device with Bus Transceivers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount |
|
SN74ABT18245ADLIC SCAN-TEST-DEV/TXRX 56-SSOP |
2,705 | - |
RFQ |
Datasheet |
Tube | 74ABT | Active | Scan Test Device with Bus Transceivers | 4.5V ~ 5.5V | 18 | -40°C ~ 85°C | Surface Mount |
|
|
NB100LVEP17MNGIC DRVR ECL QUAD 2.5V/3.3V 24QFN |
3,077 | - |
RFQ |
Datasheet |
Tube | 100LVEP | Active | Differential Receiver/Driver | 2.375V ~ 3.8V | 4 | -40°C ~ 85°C | Surface Mount |
|
MC100EP17DTGIC RCVR/DRV ECL QUAD DFF 20TSSOP |
3,364 | - |
RFQ |
Datasheet |
Tube | 100EP | Active | Differential Receiver/Driver | 3V ~ 5.5V | 4 | -40°C ~ 85°C | Surface Mount |
|
MC74F283DBINARY FULL ADDER SINGLE 4 BIT 1 |
2,748 | - |
RFQ |
Datasheet |
Bulk | 74F | Active | Binary Full Adder with Fast Carry | 4.5V ~ 5.5V | 4 | 0°C ~ 70°C | Surface Mount |
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